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Mini-Circuits components are now available as X-MWblock drop-in modules from our partner, X-Microwave to facilitate your evaluation and prototyping.
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ECCN# EAR99
Material Declaration
AN0-39 - Speed IM testing
AN0-40 - Automated compression measurements
AN0-42 - A guide to surface mount assembly
AN00-008 - Improved two-tone, third order testing
AN03-36 - Measurement methods
AN40-005 - Prevention and Control of Electrostatic Discharge ESD)
AN40-011 - Handling Moisture Sensitive Devices
AN40-014 - Surface Mount Assembly of Mini-Circuits Components
AN60-010 - Biasing MMIC Amplifiers (e.g. ERA SERIES)
AN60-038 - Definition of terms, Q&As
AN60-040 - Understanding Noise Parameter Measurements
D4-D041 - Tape & Reel Packaging For Surface Mount Devices
DG02-23A - Understanding Surface Mount
DG02-32 - Statistical process control
AN60-041 - PHA-1+: LTE Performance vs. Output Power
AN60-042 - PHA-1+: TD-SCDMA Performance vs. Output Power
AN60-106 - Flattening Negative Gain Slope with MMIC Fixed Equalizers
PCN10-017 * 08/12/2010 * Performance Changes
PCN11-019 * 11/21/2011 * Device Marking from Ink to Laser
PCN19-049 * 04/22/2019 * Change of Plating
AN40-012 - dBm - volts - watts conversion table
AN40-013 - The Effect of VSWR on Transmitted Power
DG03-111 - Return loss vs. VSWR table
SPEC1-1 - Overall Noise Figure of Two Stage Amplifier
SPEC1-2 - Insertion Loss Uncertainty Due to Mismatch Calculator
SPEC1-3 - Gain Uncertainty Due to Mismatch Calculator
Hi-Rel
Space Upscreening
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